The table below lists the equipmentConstellation has available for analytical testing and analysis. The
most common applications are included for reference.
|
Instrument |
Appl. |
Surface |
Industrial Chemistry |
Analytical Separations |
Non Destructive Analysis |
| Acoustic Emission |
|
|
|
|
|
| Atomic Absorption Spectrometry |
AAS |
|
|
|
|
| Auger Electron Spectroscopy |
AES |
|
|
|
|
| BET Surface Area Measurement |
|
|
|
|
|
| Bomb Calorimetry |
|
|
|
|
|
| C,H,N,S,O Analysis |
|
|
|
|
|
| Differential Scanning Calorimetry |
DSC |
|
|
|
|
| Energy Dispersive X-ray
Fluorescence
Spectrometry |
EDXRF |
|
|
|
|
| Gas Chromatography |
GC |
|
|
|
|
| Gel Permeation Chromatography |
GPC |
|
|
|
|
| Helium Pyncnometry |
|
|
|
|
|
| High Performance Liquid Chromatography |
|
|
|
|
|
| Inductively Coupled Plasma - Mass Spectrometry |
HPLC |
|
|
|
|
| Inductively Coupled Plasma-Atomic Emission
Spectrometry |
ICP-AES |
|
|
|
|
| Infrared Spectroscopy |
IR |
|
|
|
|
| Ion Chromatography |
IC |
|
|
|
|
| Ion Scattering Spectroscopy |
ISS |
|
|
|
|
| Karl Fischer Titration |
|
|
|
|
|
| Liquid Penetrant Testing |
|
|
|
|
|
| Mass Spectrometry |
MS |
|
|
|
|
| Optical Microscopy |
|
|
|
|
|
| Physical Testing |
|
|
|
|
|
| Rheological Testing |
|
|
|
|
|
| Scanning Electron Microscopy |
SEM |
|
|
|
|
| Secondary Ion Mass Spectrometry |
SIMS |
|
|
|
|
| Small Area X-ray
Fluorescence |
SAXRF |
|
|
|
|
| Thermogravimetric Analysis |
TGA |
|
|
|
|
| Thermomechanical Analysis |
TMA |
|
|
|
|
| Ultrasonic Microscopy |
|
|
|
|
|
| Ultraviolet/Visible Spectroscopy |
UV/Vis |
|
|
|
|
| Wavelength Dispersive X-ray
Fluorescence
Spectrometry |
WDXRF |
|
|
|
|
| X-ray Diffraction |
XRD |
|
|
|
|
| X-ray Photoelectron Spectroscopy |
XPS |
|
|
|
|
| X-ray Radiography |
|
|
|
|
|
